Current Issue Versions 5 Vol 5 (1) : 1 2024
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Sample Manuscript Showing Style and Formatting Specifications for JoMM
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Abstract & Keywords
Abstract: This paragraph shows the required format and appearance of a manuscript prepared for JoMM. The abstract is a concise (short and clear) summary. It should clearly state the problem, the methods, the main results, and the conclusions, should not include citations or formula containing no more than 200 words. Because the abstract may be used in abstracting and indexing databases, it should be self-contained (i.e., no numerical references) and substantive in nature, presenting concisely the objectives, methodology used, results obtained, and their significance. A list of up to six keywords should immediately follow, with the keywords separated by commas and ending with a period.
Keywords: JoMM; microelectronic manufacturing; journal; templates
1.   Introduction (Times New Roman, word size: 14)
This document shows the suggested format and appearance of a manuscript prepared for JoMM. Accepted papers will be professionally typeset. This template is intended to be a tool to improve manuscript clarity for the reviewers [1, 2]. The final layout of the typeset may not match this template layout [3–6].
(Times New Roman, word size: 12)
2.   Figures and Tables
Figures are numbered in the order in which they are called out in the text. Figures should be embedded in the manuscript for the initial submission, and individual figure files will be requested for the first revision in .tif, .eps, .png format. Tables are numbered in the order in which they referred to. They should appear in the document in numerical order and as close as possible to their first reference in the text.


Figure 1.   The measured and simulated S parameters.
The axis labels should be given in the form of “variable (unit)".
Table 1.   Comparison with other published PGA.
ParameterReference [7]Reference [10]This work
Technology90 nm CMOS130 nm CMOS130 nm CMOS
Resolution of delay line (ps)4.205.602.00
RMS jitter of delay line (ps)9.3311.324.71
EVM (dB)-29.81-29.53-30.85
ACPR requirementsMetMetMet
3.   Section
Author biographies are requested but not required. Biographies are not to exceed 80 words. Biographies should be placed at the end of the manuscript. Personal information such as hobbies or birthplace/birthdate should not be included.
3.1.   Section Formatting
The linearity of the delay line is defined as the deviation of delay from the ideal delay curve when the control code increases with a step of one. The delay line structure proposed in this paper is shown in Figure 2; we take the delay line structure from Reference [5] as a contrast. The transfer function is given as
. (1)
3.2.   Section Formatting
Authors are strongly encouraged to follow the principles of sound technical writing. Manuscripts that do not meet acceptable English standards or lack clarity may be rejected. Authors whose native language is not English may wish to collaborate with a colleague whose English skills are more advanced.
4.   Conclusion
The linearity and resolution of the delay line has a great effect on the transmitter performance. In order to overcome the bottleneck of low linearity and low resolution, an improved delay line structure is proposed with a calibration algorithm to conquer PVT variations for this all-digital design. Measurement results show that the proposed structure with the calibration algorithm can evidently improve the linearity and resolution of the delay line.
Acknowledgments
Acknowledgments and funding information should be added after the conclusion, and before references. Include grant numbers and the full name of the funding body. The acknowledgments section does not have a section number.
[1] G. J. Alred, C. T. Brusaw, and W. E. Oliu, Handbook of Technical Writing, 7th ed., St. Martin’s, New York (2003).
[2] L. C. Perelman, J. Paradis, and E. Barrett, Mayfield Handbook of Technical and Scientific Writing, Mayfield, Mountain View, California (1997).
[3] A. Harris et al., “Free-space optical wavelength diversity scheme for fog mitigration in a ground-to-unmanned-aerial-vehicle communications link,” Opt. Eng.45 (8), 086001 (2006).
[4] N. Metropolis et al., “Equations of state calculations by fast computing machine,” J. Chem. Phys. 21(6), 1087-1091 (1953).
[5] S. F. Gull, “Developments in maximum-entropy data analysis,” in Maximum Entropy and Bayesian Methods, J. Skilling, Ed., pp. 53-71, Kluwer Academic, Dordrecht, Netherlands (1989).
[6] K. M. Hanson, “Introduction to Bayesian image analysis,” in Image Processing, M. H. Loew, Ed., Proc. SPIE1898 , 716-731 (1993).
Each reference item should contain one and only one publication;
References must be numbered in the order that they appear in the main text;
All authors of a publication should be listed, omission is not allowed unless there are more than three of them; et al. should be used in the later case after the 3rd author to omit the others.
Normally, at least 15 references should be provided, among which at least 10 references should be published in the past 5 years.
Photography & Biography
Authors and co-authors will need to provide their own photography and biography. Words of a biography limits to 200 words.
Article and author information
Ai Fei
952187093@qq.com
Publication records
Published: Jan. 5, 2024 (Versions5
References
Journal of Microelectronic Manufacturing