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CN: DemoJournal-CN
ISSN: DemoJournal-ISSN
Research Article Archive • Versions 2 Vol 2 (3) : 19020304 2019
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An Innovative Method to Improve Model Accuracy by Implementing Multi-models Scheme for 28nm Node and Below
Qingchen Cao, Tianhui Li, Shuying Wang, Deyuan Xiaohidden
Received： 2019 - 08 - 02
Published： 2019 - 09 - 28
6034 31 0
CSCD  ·  Baidu Scholar
References
Journal of Microelectronic Manufacturing

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