Welcome to Journal of Microelectronic Manufacturing!

Journal of Microelectronic Manufacturing (JoMM) is produced by JoMMPublish in Altamont, New York, USA.

JoMM issue frequency: Quarterly

(JoMM strives for shortening the publication cycle and articles are published online as soon as accepted. Each published article is included in the current open issue for the quarter when it's published)

Publisher: JoMMPublish

Place of publication: Altamont, New York, USA


Open Access (OA) Statement

JoMM is an open access journal which means that all content is freely available without charge to the user or his/her institution. Users are allowed to read, download, copy, distribute, print, search, or link to the full texts of the articles, or use them for any other lawful purpose, without asking prior permission from the publisher or the author. This is in accordance with the BOAI definition of open access.


Article Submission Charges (ASC) Statement

There is no payment needed whatever the final decision on the submitted manuscript is.

JoMM's submission, processing and publishing charge is FREE.


JoMM is devoted to publishing research on the cutting-edge microelectronic manufacturing technology.

The scope of the journal covers studies of advanced semiconductor manufacturing sciences and technologies from fundamental research to industrial high volume manufacturing applications. The perspective scope includes, but is not limited to the following areas:



    -Circuit and Device

    -Modeling and Simulation


    -Metrology, Testing and Yield control





JoMM publishes research papers, letters, topical review articles and special issues:

Research Papers: Regular reports of original research work, normally no more than 8500 words (4-10 journal pages).

Accelerated Publications (Letters): Brief, urgent communications of no more than 3500 words (4 journal pages) that require rapid publication. Authors shall also submit a short letter explaining why the manuscript requires accelerated consideration.

Topical Review Articles: Topical reviews present a snapshot of recent progress in a particular field (no page limit). These articles present the background to a particular field and the current state of the art.

Special Issues: Special issues will be opened to cover a particular topic, authors and readers are encouraged to propose special issue ideas to editors or editorial board members. Special issue manuscript follows the same guideline as regular manuscript.


Peer Review

This journal operates a single-blind peer review policy. All submissions are preliminarily assessed for editorial suitability by an in-house editorial team ahead of formal peer review. Articles that are considered inappropriate for the journal at this initial stage will be rejected without further review.